O.O. Awadelkarim: search on Z-Library

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1

[IEEE 14th International Symposium on Power Semiconductor Devices and ICs - Sante Fe, NM, USA (4-7 June 2002)] Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics - Growth and reliability of thick gate oxide in U-trench for power MOSFETs

Wu, C.-T., Ridley, R.S., Dolny, G., Grebs, T., Knoedler, C., Suliman, S., Venkataraman, B., Awadelkarim, O., Ruzyllo, J.

Year:

2000

Language:

english

File:

PDF, 302 KB

english, 2000

2

The effects of SiO2 barrier between active layer and substrate on the performance and reliability of polycrystalline silicon thin film transistors

Y.Z Wang, O.O Awadelkarim

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 571 KB

english, 1998

3

Cancer in the Sudan: An overview of the current status of knowledge on tumor patterns and risk factors

Khalid Dafaallah Awadelkarim, Renato Mariani-Costantini, Nasr Eldin Elwali

Journal:

Science of The Total Environment

Year:

2012

Language:

english

File:

PDF, 1.42 MB

english, 2012

4

[Inst. Electr. Eng. Japan 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 - Osaka, Japan (4-7 June 2001)] Proceedings of the 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 (IEEE Cat. No.01CH37216) - Characterization of gate oxide degradation mechanisms in trench-gated power MOSFETs using the charge-pumping technique

Dolny, G., Gollagunta, N., Suliman, S., Trabzon, L., Horn, M., Awadelkarim, O.O., Fonash, S.J., Knoedler, C.M., Hao, J., Ridley, R., Kocon, C., Grebs, T., Zeng, J.

Year:

2001

Language:

english

File:

PDF, 254 KB

english, 2001

5

Damage to n-MOSFETs from electrical stress Relationship to processing damage and impact on device reliability

L. Trabzon, O.O. Awadelkarim

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 187 KB

english, 1998

6

Electrical properties of the gate oxide and its interface with Si in U-shaped trench MOS capacitors: The impact of polycrystalline Si doping and oxide composition

S.A. Suliman, B. Venkataraman, C.-T. Wu, R.S. Ridley, G.M. Dolny, O.O. Awadelkarim, S.J. Fonash, J. Ruzyllo

Journal:

Solid-State Electronics

Year:

2003

Language:

english

File:

PDF, 221 KB

english, 2003

7

High temperature bias-stress-induced instability in power trench-gated MOSFETs

Hao, J., Rioux, M., Suliman, S.A., Awadelkarim, O.O.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.43 MB

english, 2014

8

Studies of Parylene C Microfibrous Thin Films Electrical Properties

Khawaji, I. H., Awadelkarim, O. O., Lakhtakia, A.

Journal:

ECS Transactions

Year:

2016

Language:

english

File:

PDF, 307 KB

english, 2016

9

Hydrogen and processing damage in CMOS device reliability: defect passivation and depassivation during plasma exposures and subsequent annealing

O.O. Awadelkarim, S.J. Fonash, P.I. Mikulan, M. Ozaita, Y.D. Chan

Journal:

Microelectronic Engineering

Year:

1995

Language:

english

File:

PDF, 394 KB

english, 1995

10

Analysis of current–voltage–temperature characteristics in SiC Schottky diodes using threshold-accepting simulated-annealing techniques

K. Sarpatwari, L. Passmore, S.A. Suliman, O.O. Awadelkarim

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 271 KB

english, 2007

11

The effects of channel boron-doping on the performance and hot electron reliability of N-channel trench UMOSFETs

S.A. Suliman, O.O. Awadelkarim, S.J. Fonash, G.M. Dolny, J. Hao, R.S. Ridley, C.M. Knoedler

Journal:

Solid-State Electronics

Year:

2001

Language:

english

File:

PDF, 165 KB

english, 2001

12

Electron and hole trapping in the bulk and interface with Si of a thermal oxide grown on the sidewalls and base of a U-shaped silicon trench

S.A. Suliman, O.O. Awadelkarim, S.J. Fonash, R.S. Ridley, G.M. Dolny, J. Hao, C.M. Knoedler

Journal:

Solid-State Electronics

Year:

2002

Language:

english

File:

PDF, 208 KB

english, 2002

13

The effects of substrates on the characteristics of polycrystalline silicon thin film transistors

Y.Z Wang, O.O Awadelkarim, J.G Couillard, D.G Ast

Journal:

Solid-State Electronics

Year:

1998

Language:

english

File:

PDF, 311 KB

english, 1998

14

Changes in material properties of low-k interlayer dielectric polymers induced by exposure to plasmas

L Trabzon, O.O Awadelkarim

Journal:

Microelectronic Engineering

Year:

2003

Language:

english

File:

PDF, 397 KB

english, 2003

15

The dependence of UMOSFET characteristics and reliability on geometry and processing

Suliman, S A, Gollagunta, N, Trabzon, L, Hao, J, Ridley, R S, Knoedler, C M, Dolny, G M, Awadelkarim, O O, Fonash, S J

Journal:

Semiconductor Science and Technology

Year:

2001

Language:

english

File:

PDF, 396 KB

english, 2001

16

The impact of metal-1 plasma processing-induced hot carrier injection on the characteristics and reliability of n-MOSFETs

El Hassan, M.G., Awadelkarim, O.O., Werking, J.D.

Journal:

IEEE Transactions on Electron Devices

Year:

1998

Language:

english

File:

PDF, 145 KB

english, 1998

17

Frequency- and temperature-dependent storage and loss moduli of microfibrous thin films of Parylene C

Chindam, Chandraprakash, Lakhtakia, Akhlesh, Brown, Nicole R., Orfali, Wasim, Awadelkarim, Osama O.

Journal:

Materials Letters

Year:

2014

Language:

english

File:

PDF, 896 KB

english, 2014

18

[IEEE 2011 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2011.10.16-2011.10.20)] 2011 IEEE International Integrated Reliability Workshop Final Report - Observation of negative bias temperature instabilities in parasitic p-channel MOSFETs occurring during high-temperature reverse-bias stressing of trench-gated n-channel MOSFETs

Hao, Jifa, Rioux, Mark, Awadelkarim, Osama O.

Year:

2011

Language:

english

File:

PDF, 412 KB

english, 2011

19

Electrical properties of contact etched p-Si: A comparison between magnetically enhanced and conventional reactive ion etching

Awadelkarim, O. O., Mikulan, P. I., Gu, T., Reinhardt, K. A., Chan, Y. D.

Journal:

Journal of Applied Physics

Year:

1994

Language:

english

File:

PDF, 1.43 MB

english, 1994

20

Defect states in carbon and oxygen implanted p-type silicon

Awadelkarim, O. O., Suliman, S. A., Monemar, B., Lindström, J. L., Zhang, Y., Corbett, J. W.

Journal:

Journal of Applied Physics

Year:

1990

Language:

english

File:

PDF, 884 KB

english, 1990

21

Alternating donorlike-acceptorlike configurationally bistable defect in irradiated phosphorus-doped silicon

Awadelkarim, O. O., Monemar, B.

Journal:

Physical Review B

Year:

1988

Language:

english

File:

PDF, 194 KB

english, 1988

22

Deep Donor-Acceptor Pair Recombination in Bulk GaP Studied by ODMR and DLTS Techniques

Awadelkarim, O.O., Godlewski, M., Monemar, Bo

Journal:

Materials Science Forum

Year:

1989

File:

PDF, 407 KB

1989

23

Strain Effects Induced by Gold Diffusion in Silicon

Henry, Anne, Weman, H., Awadelkarim, O.O., Monemar, Bo

Journal:

Materials Science Forum

Year:

1989

File:

PDF, 350 KB

1989

24

Microfiber inclination, crystallinity, and water wettability of microfibrous thin-film substrates of Parylene C in relation to the direction of the monomer vapor during fabrication

Chindam, Chandraprakash, Wonderling, Nichole M., Lakhtakia, Akhlesh, Awadelkarim, Osama O., Orfali, Wasim

Journal:

Applied Surface Science

Year:

2015

Language:

english

File:

PDF, 3.57 MB

english, 2015

25

Reply to “Comment on ‘Surface energy of Parylene C’ ”

Chindam, Chandraprakash, Lakhtakia, Akhlesh, Awadelkarim, Osama O.

Journal:

Materials Letters

Year:

2016

Language:

english

File:

PDF, 237 KB

english, 2016

26

[IEEE 2016 Conference of Basic Sciences and Engineering Studies (SGCAC) - Khartoum, Sudan (2016.2.20-2016.2.23)] 2016 Conference of Basic Sciences and Engineering Studies (SGCAC) - Modeling of human hand fingers states using electromyography and logistic regression

Ali, Eyas Awadelkarim Hamid, Mohamed, Ahmed Yousif Shamad

Year:

2016

Language:

english

File:

PDF, 509 KB

english, 2016

27

Parylene-C microfibrous thin films as phononic crystals

Chindam, Chandraprakash, Lakhtakia, Akhlesh, Awadelkarim, Osama O

Journal:

Journal of Micromechanics and Microengineering

Year:

2017

Language:

english

File:

PDF, 4.63 MB

english, 2017

28

Effects of constant-voltage stress on the stability of Parylene-C columnar microfibrous thin films

Khawaji, Ibrahim H., Awadelkarim, Osama O., Lakhtakia, Akhlesh

Journal:

IEEE Transactions on Dielectrics and Electrical Insulation

Year:

2019

Language:

english

File:

PDF, 962 KB

english, 2019

29

[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs

Ghosh, Amartya, Hao, Jifa, Cook, Michael, Kendrick, Chris, Suliman, Samia A., Hall, Gavin D.R., Kopley, Tom, Awadelkarim, Osama O.

Year:

2020

File:

PDF, 978 KB

2020

30

Polycrystalline Silicon/Dielectric/Substrate Material Systems for Thin Film Transistor Applications: The Impact of Material Properties on Transistors' Characteristics

Y. Z. Wang, O. O. Awadelkarim

Journal:

physica status solidi (a)

Year:

1999

Language:

english

File:

PDF, 590 KB

english, 1999

31

Low temperature radiation damage in silicon: II. Production rates and annealing studies on p-type material

O.O. Awadelkarim

Journal:

Year:

1987

Language:

english

File:

PDF, 373 KB

english, 1987

32

Divacancies production in irradiated n-type silicon

O.O. Awadelkarim

Journal:

Year:

1988

Language:

english

File:

PDF, 489 KB

english, 1988

33

Effects of deuterium plasma treatments on the electrical properties of boron-doped silicon

A. Henry, O.O. Awadelkarim, J.L. Lindström, G.S. Oehrlein

Journal:

Materials Science and Engineering: B

Year:

1989

Language:

english

File:

PDF, 356 KB

english, 1989

34

Primary and secondary reduction products in irradiated acetic, monofluoroacetic and glycolic acid single crystal

O. Awadelkarim, A. Lund, P.O. Samskong

Journal:

International Journal of Radiation Applications and Instrumentation. Part C. Radiation Physics and Chemistry

Year:

1986

Language:

english

File:

PDF, 508 KB

english, 1986

35

Gate-oxide grown on the sidewalls and base of a U-shaped Si trench: effects of the oxide and oxide/Si interface condition on the properties of vertical MOS devices

S.A. Suliman, O.O. Awadelkarim, R.S. Ridley, G.M. Dolny

Journal:

Microelectronic Engineering

Year:

2004

Language:

english

File:

PDF, 218 KB

english, 2004

36

Extracting the Schottky barrier height from axial contacts to semiconductor nanowires

K. Sarpatwari, N.S. Dellas, O.O. Awadelkarim, S.E. Mohney

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 862 KB

english, 2010

37

Fowler–Nordheim and hot carrier reliabilities of U-shaped trench-gated transistors studied by three terminal charge pumping

L.J. Passmore, K. Sarpatwari, S.A. Suliman, O.O. Awadelkarim, R. Ridley, G. Dolny, J. Michalowicz, C.-T. Wu

Journal:

Thin Solid Films

Year:

2006

Language:

english

File:

PDF, 239 KB

english, 2006

38

On the capacitance of metal/high-k dielectric material stack/silicon structures

J Jiang, O.O Awadelkarim, D.-O Lee, P Roman, J Ruzyllo

Journal:

Solid-State Electronics

Year:

2002

Language:

english

File:

PDF, 115 KB

english, 2002

39

A comparison between plasma charging-damage and inductive-damage: Damage response to Fowler-Nordheim stress

A Salah, O.O Awadelkarim, J Werking, G Bersuker, Y.D Chan

Journal:

Solid-State Electronics

Year:

1996

Language:

english

File:

PDF, 659 KB

english, 1996

40

A study of carrier-trap generation by Fowler-Nordheim tunneling stress on polycrystalline-silicon/SiO2/silicon structures

J. Jiang, O.O. Awadelkarim, Y.D. Chan

Journal:

Solid-State Electronics

Year:

1997

Language:

english

File:

PDF, 561 KB

english, 1997

41

The effects of interlayer dielectric deposition and processing on the reliability of n-channel transistors

L Trabzon, O.O Awadelkarim, J Werking

Journal:

Solid-State Electronics

Year:

1998

Language:

english

File:

PDF, 229 KB

english, 1998

42

The impact of RCA treatment of glass substrates on the properties of polycrystalline silicon thin film transistors

O.O. Awadelkarim, Y.Z. Wang

Journal:

Microelectronic Engineering

Year:

1999

Language:

english

File:

PDF, 291 KB

english, 1999

43

Minority carrier injection limited current in Re/4H-SiC Schottky diodes

K. Sarpatwari, S. E. Mohney, S. Ashok, O. O. Awadelkarim

Journal:

physica status solidi (a)

Year:

2010

Language:

english

File:

PDF, 245 KB

english, 2010

44

The Role of Group-V Impurities in Defect Formation in Irradiated Silicon

O. O. Awadelkarim, A. Henry, B. Monemar, J. L. Lindström

Journal:

physica status solidi (a)

Year:

1990

Language:

english

File:

PDF, 558 KB

english, 1990

45

Metal-induced solid-phase crystallization of hydrogenated amorphous silicon: dependence on metal type and annealing temperature

Y.Z. Wang, O.O. Awadelkarim

Journal:

Applied Physics A: Materials Science & Processing

Year:

2000

Language:

english

File:

PDF, 81 KB

english, 2000

46

BRCA1andBRCA2status in a Central Sudanese series of breast cancer patients: interactions with genetic, ethnic and reproductive factors

Khalid Dafaallah Awadelkarim, Gitana Aceto, Serena Veschi, Ahmed Elhaj, Annalisa Morgano, Ahmed Abdalla Mohamedani, Elgaylani Abdalla Eltayeb, Dafaallah Abuidris, Mario Di Gioacchino, Pasquale Battist

Journal:

Breast Cancer Research and Treatment

Year:

2007

Language:

english

File:

PDF, 240 KB

english, 2007

47

The effects of glass-substrate’s surface-treatment on the characteristics of N-channel polycrystalline silicon thin film transistors

Y. Z. Wang, O. O. Awadelkarim

Journal:

Journal of Electronic Materials

Year:

1998

Language:

english

File:

PDF, 110 KB

english, 1998

48

Low-temperature radiation damage in silicon: I. Annealing studies on n-type material

O.O. Awadelkarim

Journal:

Year:

1987

Language:

english

File:

PDF, 631 KB

english, 1987

49

Pathological, clinical and prognostic characteristics of breast cancer in Central Sudan versus Northern Italy: implications for breast cancer in Africa

K D Awadelkarim, C Arizzi, E O M Elamin, H M A Hamad, P De Blasio, S O Mekki, I Osman, I Biunno, N E Elwali, R Mariani-Costantini, M C Barberis

Journal:

Year:

2008

Language:

english

File:

PDF, 527 KB

english, 2008

50

ChemInform Abstract: Methylenebissantin (I): A Rare Methylene-Bridged Bisflavonoid from Dodonaea viscosa which Inhibits Plasmodium falciparum Enoyl-ACP Reductase.

Akhtar Muhammad, Itrat Anis, Zulfiqar Ali, Sufyan Awadelkarim, Ajmal Khan, Asaad Khalid, Muhammad Raza Shah, M. Galal, Ikhlas A. Khan, M. Iqbal Choudhary

Journal:

Year:

2012

File:

PDF, 22 KB

2012

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